TDDB / HTRB HV Test system
High Voltage High Temperature Reliability Test System
The TDDB / HTRB HV Tester is used for long-term measurements with high voltage dc bias. During this long-term measurement, an adjustable bias voltage is applied to the DUTs (Device under Test). In an adjustable measuring interval, all measuring channels are measured sequentially and stored as a data set.
The Tester provides an ATV own oven interface for various DUT holder mainboards. These mainboards are customizable to provide sockets and connectors for your needs. For HTRB application additional Gate Bias sources are available.
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