4200-SCS

Parameter analyzer

Accelerate research, reliability and failure analysis studies of semiconductor devices, materials and process development with the 4200-SCS. The highest performance parameter analyzer, it delivers synchronizing current-voltage (I-V), capacitance-voltage (C-V) and ultra-fast pulsed I-V measurements.

  • Biosensor Characterization
  • Femtofarad Capacitance Measurements
  • Semiconductor and NVM Reliability
  • C-V Measurement for High Impedance Applications
  • MOSFET Characterization

 

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