T90™
Designed for mounting on a standard 4.5″ probe card holder for multi-site wafer level reliability testing
T90™ with Advanced Cantilever™ technology Series Probe Card The 90 mm tile was designed for mounting on a standard 4.5″ probe card holder for multi-site wafer level reliability testing. The 1.6 mm (0.062″) thick rails allow the chassis to slip into planarity adjustable probe card holders for most analytical probe stations.