T300 ButtonTile™

Designed for long-term, multi-site, high-density wafer level reliability or burn-in tests up to 400°C

  • 300 millimeter ceramic button probe card
  • Optimized for multi-site WLR
  • For use with the Celadon Modular Adapter™
  • Temperature compensated for use from -65°C to 350°C (options to 400°C)
  • fA level leakage measurements

The Celadon T300™ probe cards are designed for long-term, multi-site, high-density wafer level reliability or burn-in tests up to 400°C. In today’s economic environment, conventional reliability data is needed quickly while eliminating the cost, electrical stress, and delay of parts packaging while maintaining a wafer performance map.

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